High-resolution X-ray inspection system specialist Feinfocus embarked on a global technical seminar program that included North America, Europe and Asia. Led by Dr. Udo E. Frank, director of the technology development, the seminars were conducted with the support of the distributors in each region. The tutorials covered topics from basic X-ray inspection technology to advanced methods, such as computed tomography and wafer-bump inspection. With a simulation in the graphical user interface software, attendees was given a real-time live demo of inspection processes. Due to the success, the company plans to expand the seminar series in 2005, with further information to be posted at its web site.
EPP EUROPE 410
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