The Feinfocus graphical user interface (FGUI) now features an automated low-dose-radiation mode that instantly switches off the radiation during sample manipulation and motion. This improvement was developed to meeting the demands for reduced radiation exposure in order to ensure product reliability. The X-ray system automatically blocks unnecessary radiation by deflecting the X-ray beam within milliseconds so that the object under inspection is no longer exposed to radiation during motion of the manipulator. Although the company has never experienced an X-ray inspection process that caused any damage to the sample, manufacturers of certain flash memories are concerned about radiation exposure. With the low-dose mode, those users now have a reliable solution. In addition, the clever use of filters, as well as collimators, may also help to substantially reduce radiation exposure.
EPP EUROPE 444
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