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Tester and programmer with JTAG system

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Tester and programmer with JTAG system

ScanWorks, a JTAG test system (boundary scan) from Asset (a Texas Instruments’ spin-off) has been integrated seamlessly into Agilent’s in-circuit test (ICT) system Medalist i5000. The company features the bundled solution on its ICT equipment line, and refers to its boundary-scan solution as Medalist ScanWorks. This bundles with a boundary-scan tool and silicon nails, operating with boundary-scan chains to automatically test non-boundary-scan devices. Users can migrate tests from their design to manufacturing. In another step, ScanWorks has also been integrated into Lattice Semiconductor’s ispVM System, a programming engine that supports the IEEE 1532 standard for in-system configuration. The same system that applies boundary-scan tests to a board assembly can also program multiple on-board logic devices concurrently, reducing programming time and increasing the efficiency of manufacturing operations. The system is currently used by corporations such as Cisco, Lucent, BAE, Alcatel, Hewlett-Packard, Ericsson, Intel, Raytheon, SBS, Solectron, Rockwell Collins, EMC and others.

EPP EUROPE 453
Current Issue
Titelbild EPP EUROPE Electronics Production and Test 11
Issue
11.2023
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