The Aerial Flying Probe test system from Seica is based on the core hardware and software of the VIVA Integrated Platform (VIP) and uses four completely independent, mobile test probes to carry out tests on both sides of the board under test (two on each side). It is particularly indicated for testing prototypes, samples and small-to-medium production runs, providing maximum flexibility of use to reduce the time and costs of board development. The vertical, very compact structure of Aerial M4 makes it easy to load and test even very large boards and its clamping system ensures that there is virtually no vibration or oscillation of the board during test for maximum probing efficiency.
As the standard electrical test, the test system uses the company’s proprietary OTPN (One Touch Per Net) technique: multi-tone signals are injected through the nets of the UUT and the results are analyzed with Fast Fourier Transforms (FFT) to characterise the net and identify faults on subsequent boards to be tested. Other tests, for example verification of junction faults, are also executed during the same OPTN. In this way test program generation is simple and immediate, fault coverage is high and throughput is maximized.
According to the company, the test system represents a simple, immediate solution to those customers who need to implement a test strategy that is cost-effective and is very easy to program and operate, even for non-specialized personnel.
Options include the in-circuit test and visual inspection software modules and the system is provided with data collection and statistics functions, and, since it is based on VIP technology, it is fully compatible with the Pilot Flying Probe, Strategy In-circuit and Valid Functional testers from the company.
All of this is packed into a compact yet easy-to-load system that, depending on the model, can accommodate large boards up to 24” x 24” in size.
SMT, hall 7, booth 247
EPP Europe 476
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