JTAG Technologies has introduced the JT 2111/MPV Digital I/O Scan (DIOS) module. The module retains a legacy form-factor and default settings but adds programmable voltages to facilitate the enhanced testing of complex printed circuit boards. When connected to a circuit board via edge connector or fixture test pins the module enhances regular interconnect tests by exercising the board’s connections in synchronisation with native boundary-scan components. The module features PLDs (Programmable Logic Devices) and a 10 MHz oscillator, so it can be programmed to perform more custom functional and pattern tests.
Peter van den Eijnden, JTAG Technologies’ Managing Director comments: „The JT 2111/MPV DIOS Test Module provides a ‘best-of-both-worlds’ solution when it comes to implementing boundary-scan and functional tests. For example, a target circuit board may contain elements, such as board-edge connectors and non-boundary-scan logic clusters, which cannot be accessed directly by boundary-scan. In such cases, the overall testability of the board is compromised, allowing some manufacturing faults to go undetected. The DIOS module overcomes this problem by extending the reach of boundary-scan to include the testing of circuit board edge connectors and by providing extra test points internal to the PCB to improve fault coverage.“
In addition, the module’s hot-swap feature offers improved test throughput by allowing test targets to be connected/disconnected from the fixture without cycling power.
100 % backward compatibility with previous versions is ensured by simulation of the former DIOS devices. What’s more both output and input thresholds can be programmed to 1.5, 1.8, 2.5 or 3.3 V making the module ideally suited to testing modern low-voltage logic families. The I/O channels are grouped into blocks of 16 channels and, to reduce scan chain length and improve test efficiency, any number of 16-channel groups can be bypassed.
Selected channels can be interfaced with custom cabling to the board under test (low volume apps) or interfaced with bed-of-nails fixtures for higher volume production. The I/O channels are individually programmable as input, output, bi-directional or tri-state signals. Up to 10 JT 2111/MPV DIOS modules can be daisy-chained together to provide a massive 640 I/O channel count.
Van den Eijnden concludes: „The JT 2111/MPV DIOS is extremely versatile and offers a low-cost and modular method for adding JTAG compliant I/O to any test strategy. Moreover, they’re manufactured and supported by the market-leading and longest-established boundary-scan company in the business.“
Productronica, Stand A1.458
EPP Europe 457
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