The combination of AOI and boundary-scan technologies from Goepel is now available for in-line environment. The amalgamation of two methods in a single system allows the detection of defects which cannot be identified by AOI or scan alone. The combi instrument consists of BS software and hardware integrated into OptiCon AdvancedLine and SpeedLine AOI systems. A universal adaptor connects power supplies and the JTAG bus to the unit under test. Test coverage is extended by a special test probe mounted on the camera for checking BS IC pins which do not have connections to other BS pins. A unit monitors the UUT power consumption during test, to detect any shorts in power supply circuitry, thereby avoiding damage to the UUT or invalid results. The concept of this test combination reportedly assures a high test coverage (nearly 100 %) on board assemblies.
EPP EUROPE 471
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