Advantest’s T2000 series is a line of ATE systems based on the Openstar platform recently introduced by the Semiconductor Test Consortium (STC), to verify systems-on-chip (SoCs) and other complex devices. Rapid advancements in semicon-ductor technology have typically required users to purchase systems every two to three years. With the standardized and open system architecture, on which T2000 is based, chipmaker can implement a cost-effective solution that adapts to their ever-changing needs. With its specifications outlined by the STC, the architecture is accessible to all test-product vendors. The T2000 incorporates a range of features and capabilities, and can easily be configured for testing microprocessors, microcontrollers and RF devices by choosing from an expanding number of instrumentation modules. These modules include 250 MHz digital elements, low and high-current device power-supply units, and synchronization parts (for multiple time-domain and asynchronous-functional test). The machine can thus accommodate multiple scenarios, including high-speed device test, at-speed test of sophisticated devices, design-for-test (DFT), and engineering test conducted in laboratory settings. All modules support high-speed data transfer. A key feature is the ability to deliver true hardware and software interoperability. The open architecture provides the common ground for EDA and ATE companies to jointly adopt and support a variety of industry standards, together with a mainframe that hosts a dual computing feature for both the system and site controllers. Multiple controllers allow for independent, concurrent testing of multiple devices. For programming, users can employ either C++ or the Openstar OTPL language.
EPP EUROPE 478
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