Impix, the scientific grade camera and detector combination, improves the Revolution NanoTech X-ray inspection system from X-Tek. The camera boasts real-time frame rates at full camera resolution and full dynamic range. Using the InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing. The system provides over 65 thousand levels of grey to assist in distinguishing fine features in components. Supplied with the On Chip Integration feature, it is capable of imaging very transparent materials at very low X-ray energies. The camera will also enhance the computerized tomography (C.T.) option on the inspection system by improving the voxel resolution capability. The validation station option allows viewing/reviewing of captured data off line, enabling continued use of the X-ray system for production. Data can be accessed remotely by serial number or by barcode scanning. C.T. produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects. The system features sub-micron defect detection, 75 degree oblique viewing, digital detectors and automatic BGA software. Reportedly, it offers the highest degree of off axis tilt available and NanoTechT open tube technology for high resolution. It provides maximum magnification at all angles over the 16 ” x 16 ” manipulator scan area, for 100 % BGA, µBGA, multilayer board and PCB solder joint inspection, with analysis of BGA ball wetting, attachment, cracks and delaminations.
EPP Europe 455
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