The GEM series of Machine Vision Products is modeled after the high-performance AutoInspector 1820 series, allowing similar advanced capabilities to an off-line AOI tabletop system. The compact series reportedly has a 50% smaller footprint than comparable systems. With solder-joint inspection and measurement capabilities similar to MVP’s existing in-line systems, it offers an optimized price to performance ratio. Additionally, as an extremely flexible solution, it features compatibility and program portability with the other inspection instruments. The GEM series comes standard with one large-format digital camera and a high precision XY stage, allowing for a configurable field of view depending on the application. The standard pixel resolution is adjustable from 17 to 22µm/pixel. This high-resolution capability is combined with a flying camera technology, offering comprehensive defect coverage, accuracy and speed. The tabletop has CAD-driven, library-based programming software. It utilizes adaptable algorithms with the high detectability and low-ppm false accepts and rejects. The system can be deployed for post-reflow inspection, and includes insufficient and excess solder detection.
EPP EUROPE 450
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