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An open platform with third-party connectivity and compatibility

LabVIEW 8 delivers distributed machine/computer intelligence for design, control and test in many applications
An open platform with third-party connectivity and compatibility

National Instruments has now launched the LabVIEW 8, a major upgrade to the graphical development platform, improving the productivity of users in design, control and test. This move now introduces distributed intelligence, a powerful suite of capabilities to easily design, distribute and synchronize intelligent devices and systems. The software also features a project-based environment for developing and managing large-scale applications as well as the latest in Express technology for simplified instrument control. This release also includes significant updates to some of the key modules of the program. “For nearly 20 years, LabVIEW has become the preeminent solution for instrumentation system design offering unparalleled productivity to engineers and scientists”, says found and CEO James Truchard. “With this release, we expand the platform even further to increase productivity for a broader range of applications and technologies, including heterogeneous test systems, rapid system prototyping, full-scale system automation and embedded real-time, FPGA and microprocessor systems – all using the same time-proven, open and intuitive platform”.

This upgrade extends graphical programming further into test and control systems, from rack-and-stack solutions to automation plant networks, with flexible and easy-to-use distributed communication and control tools. It presents a simplified, scalable interface for communicating with and synchronizing between remote devices and systems, such as real-time processors and FPGAs. Test and control system engineers now can use the same graphical platform for simple data transfer, deterministic real-time communication and network synchronization with integrated alarms, events and data logging. As a user says, “LabVIEW has evolved into the premier software tool for industrial measurement and control applications”. With a LabIEW-based approach, engineers can synchronize nodes and incorporate either NI real-time and FPGA-based programmable automation controllers or third-party PLCs of their choice. LabVIEW 8 dramatically simplifies the development, testing and support of distributed applications in test, control and design.

The LabVIEW Project environment allows for managing large applications and team development. It also includes tools for multiple target management, integrated code differencing and source-code control, multi-build management, and the ability to seamlessly deploy applications. With these features, users can more easily integrate LabVIEW into advanced software engineering processes required for managing large teams of programmers or for compliance with defined development process certification standards.
Additionally, LabVIEW 8 continues to build on Express technology with tools for simplifying instrument control and data acquisition. With the Instrument Driver Finder, users now can automatically recognize connected instruments and search, download and install the appropriate driver from the more than 4,000 available on the NI Instrument Driver Network (www.ni.com/idnet The automated process eliminates tedious manual configuration and setup time, significantly reducing the time to first measurement. With an enhanced DAQ Assistant as well as NI-DAQmx 8 support for simulating data acquisition devices, users can begin programming their applications without hardware.
National Instruments offers LabVIEW 8 in multiple languages, including French, German, Japanese and Korean, as well as documentation in simplified Chinese. With this release, NI reportedly paves the way for even more third-party connectivity with LabVIEW, an open platform featuring compatibility with, for example, more than 4,000 GPIB/IEC-Bus, VXI, PXI, PCI, serial, ethernet and USB-controlled measurement devices. LabVIEW is available on Windows, Macintosh and Linux operating systems.
EPP EUROPE 408
Current Issue
Titelbild EPP EUROPE Electronics Production and Test 11
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11.2023
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