The latest custom-designed 3D measuring system of LPKF Motion & Control analyzes extremely fine microelectronics structures and delivers very fast and highly accurate results with a Z-resolution of better than 0.5µm. The system can measure BGA interposers and detect errors by automatically calculating positions, sizes and heights of bumps. At the heart of the system is a set of three confocal Siscan line sensors mounted on a granite-based XY-scanning table with air bearings. The machine features an automated handling unit with input and output tray storage and an error-sorting unit. The system can also be prepared for other complex measuring tasks in electronic production. Manufacturers of microelectronics who have to verify those fine structures can raise the product quantity and quality assurance strategy by using the system.
EPP EUROPE 456
Share:
