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Pickering Interfaces adds 67 GHz terminated switches to PXI microwave MUX

Supporting 5G and semiconductor test
Pickering Interfaces adds 67 GHz terminated switches to PXI microwave MUX

Pickering Interfaces adds 67 GHz terminated switches to PXI microwave MUX
The company has augmented its 4x-785C range of SP4T & SP6T microwave multiplexers with the addition of 67 GHz terminated SP4T / SP6T modules to support the latest requirements of the 5G and semiconductor test sectors

Source: Pickering Interfaces

Supplier of modular signal switching and simulation solutions for use in electronic test and verification, Pickering Interfaces, has augmented its 4x-785C range of SP4T & SP6T microwave multiplexers with the addition of 67 GHz terminated SP4T / SP6T modules to support the latest requirements of the 5G and semiconductor test sectors. The 40-785C (PXI) and 42-785C (PXIe) modules feature internal relay terminations that can improve signal integrity. Devices feature panel and remote mount options that enable users to locate the switches at the most convenient location for their application; remote mount options occupy a single chassis slot but can control up to three switches, saving space.

The 4x-785C family is based on Radiall mechanical microwave switches. The addition of 67 GHz 50 Ω internally terminated switches allows unused channels of a test system to be terminated in the characteristic impedance of the signal path, thus maximizing signal integrity.

Remote mount options connect each switch to the control module via a 1.5 M cable providing flexibility in switch positioning. This reduces the length of RF connections, thus maximizing performance and minimizing cabling costs. Chassis slot count is minimized as only 3-slots are required for a single configuration – or 6-slots for dual panel mount switch – or just a single slot for the remote mount versions.

“To aid with test system health monitoring, the 4x-785C family is provided with a switch cycle counting feature,” said Steve Edwards, Switching Product Manager at Pickering Interfaces. “Determining the number of operations per channel can help manage the wear-out process by allowing alternate lower usage paths to be substituted for high-use channels.”

www.pickeringtest.com

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Titelbild EPP EUROPE Electronics Production and Test 11
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