The compact and highly in-tegrated functional tester CT250M from Dr. Eschke Elektronik features 250MS/s in all-channel and 1GS/s in analog mode. Designed for maximum 640 digital channel operation (Kelvin contacting), 2M test vectors and variable signal levels, it allows dynamic functional tests of complex boards. Analog tests can be performed via bi-directional digital modules (tests per pin, level, leakage, loads). The measurement unit has two high-res analog modules, a number of four-quadrant sources, arbitrary generator, scope module and two guarding amplifiers. For scalability of the scanner hardware, the user can select options. Programmable DUT power supplies and load modules (0 to 5.5V/11A and 0 to 52V/1.5A), electronic loads and current sources are available, including potential-free outputs and cascading for higher voltages and currents. An embedded RISC/ DSP controls the instrument and the communication with an external PC. The user interfaces provide intuitive access. Latest software standards have been made available, and programming languages need not be learned. Very little training is required since teach-in, pattern export and import functions can be supplied, as can data logging and a communication link. The software runs under any MS operating system. The instrument provides manufacturing defect analyzer and function test modes (combined or stand-lone). A rack version is available, and the modular architecture can be extended to match special customer requirements.
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