Phoenix has introduced the X-ray inspection system analyzer xl with a detail detectabilty of down to less 1 micron. The outstanding feature is the large scanning area which allows the inspection of even oversized boards with a dimension of up to 24 x 36-in. In combination with the multilayer test-software ml-module and the auto positioning system, it is possible to determine the annular ring width according to a free programmable inspection scheme. Fur-thermore, in the oblique view at highest magnification (OVHM) a detailed in-spection of through-hole plating and microvia metallization can be conveyed. In addition, the rotation table allows a view from 0 to 360-degree.
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