The latest release 4.01 of Goepel’s software tool suite System Cascon offers features that further simplify boundary-scan test development. The automated test-program generation (ATPG) now automatically resolves and tests multiple non-boundary scan buffer/transceiver stages. This includes the recognition of control signals tied to VCC or GND directly or via pull-resistors and dramatically increases test coverage for the interconnect test, avoiding the need of separate cluster tests. The device library includes the ability to describe passive components and device arrays, which had to be classified in a separate ASCII file before. The release provides automated generation of go/no-go memory cluster tests (in addition to those tests at pin-level), to allow faster test execution. The programming language has been extended: powerful branching instructions, variables and string processing functions provide for simplified test program development. The CAD import processor gives access to all filters. Test station DLL is now available for integration of tests developed with Cascon in third-party equipment and test executive software, also, the repair station is now available as DLL.
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